• DocumentCode
    2372012
  • Title

    System level performance analysis of carbon nanotube global interconnects for emerging chip multiprocessors

  • Author

    Pasricha, Sudeep ; Kurdahi, Fadi ; Dutt, Nikil

  • Author_Institution
    Center for Embedded Comput. Syst., Univ. of California at Irvine, Irvine, CA
  • fYear
    2008
  • fDate
    12-13 June 2008
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    Although carbon nanotubes (CNTs) have been widely proposed as interconnect fabrics for future ultra deep submicron (UDSM) technologies, there is a lack of system-level performance analysis using these interconnects. In this paper, we investigate the performance of four CNT alternatives that may replace conventional copper (Cu) interconnects at the global interconnect level - (i) single walled CNTs (SWCNTs), (ii) SWCNT bundles, (Hi) multi-walled CNTs (MWCNTs) and (iv) bundles of mixed SWCNTs/MWCNTs. Detailed RLC equivalent circuit models for conventional CNT interconnects are described and used to calculate propagation delays. These models are then incorporated into a system-level environment to estimate the impact of using CNT global interconnects on the overall performance of several multi-core chip multiprocessor (CMP) applications. Our results indicate that MWCNTs can provide the most significant performance speedup among the CNT alternatives (up to 1.9x) over Cu global interconnects. With further improvements in CNT fabrication technology, it is shown that mixed SWCNT/MWCNT bundles and SWCNT bundles can also become viable global interconnect alternatives.
  • Keywords
    carbon nanotubes; copper; equivalent circuits; integrated circuit interconnections; multiprocessing systems; Cu; RLC equivalent circuit models; carbon nanotube global interconnects; multi-core chip multiprocessor; multi-walled CNT; propagation delays; single walled CNT; system level performance analysis; Carbon nanotubes; Conductivity; Copper; Equivalent circuits; Fabrication; Fabrics; Integrated circuit interconnections; Performance analysis; Propagation delay; RLC circuits; CMP; UDSM; carbon nanotube; interconnect;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoscale Architectures, 2008. NANOARCH 2008. IEEE International Symposium on
  • Conference_Location
    Anaheim, CA
  • Print_ISBN
    978-1-4244-2552-5
  • Electronic_ISBN
    978-1-4244-2553-2
  • Type

    conf

  • DOI
    10.1109/NANOARCH.2008.4585785
  • Filename
    4585785