Title :
Fault detection by transient transition count testing
Author :
Huang, Kuo Chan ; Ming Yu Chen ; Lee, Chung Len ; Chen, Ming Yu
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
A new testing scheme, transient transition count (TTC) testing, which is able to detect hard-to-test faults and redundant faults, in addition to conventional stuck-at faults, is proposed. The scheme is based on applying a pair of transition patterns and observing the transition count of the transient output response of a circuit to defect faults. A fast and memory-efficient fault simulator which is based on PPSFP mechanism but can handle timing is implemented. Experimental results show that this scheme can reach a higher fault coverage than the conventional stuck-at fault testing
Keywords :
digital simulation; fault diagnosis; fault location; logic testing; performance evaluation; PPSFP mechanism; fault coverage; fault detection; hard-to-test faults; memory-efficient fault simulator; redundant faults; stuck-at faults; transient output response; transient transition count testing; transition count; transition patterns; Circuit faults; Circuit simulation; Circuit testing; Electrical fault detection; Fault detection; Hazards; Logic circuits; Logic testing; Test pattern generators; Timing;
Conference_Titel :
Test Symposium, 1994., Proceedings of the Third Asian
Conference_Location :
Nara
Print_ISBN :
0-8186-6690-0
DOI :
10.1109/ATS.1994.367260
