Fault detection by transient transition count testing

Author

Huang, Kuo Chan ; Ming Yu Chen ; Lee, Chung Len ; Chen, Ming Yu

Author_Institution

Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan

fYear

1994

fDate

15-17 Nov 1994

Firstpage

14

Lastpage

19

Abstract

A new testing scheme, transient transition count (TTC) testing, which is able to detect hard-to-test faults and redundant faults, in addition to conventional stuck-at faults, is proposed. The scheme is based on applying a pair of transition patterns and observing the transition count of the transient output response of a circuit to defect faults. A fast and memory-efficient fault simulator which is based on PPSFP mechanism but can handle timing is implemented. Experimental results show that this scheme can reach a higher fault coverage than the conventional stuck-at fault testing

Keywords

digital simulation; fault diagnosis; fault location; logic testing; performance evaluation; PPSFP mechanism; fault coverage; fault detection; hard-to-test faults; memory-efficient fault simulator; redundant faults; stuck-at faults; transient output response; transient transition count testing; transition count; transition patterns; Circuit faults; Circuit simulation; Circuit testing; Electrical fault detection; Fault detection; Hazards; Logic circuits; Logic testing; Test pattern generators; Timing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 1994., Proceedings of the Third Asian

Conference_Location

Nara

Print_ISBN

0-8186-6690-0

Type

conf

DOI

10.1109/ATS.1994.367260

Filename

367260