Title :
A 34word x 64b 10R/6W write-through self-timed dual-supply-voltage register file
Author :
Tzartzanis, N. ; Walker, W.W. ; Nguyen, H. ; Inoue, A.
Author_Institution :
Fujitsu Laboratories of America
Keywords :
Automatic testing; Circuit testing; Decoding; Delay effects; Laboratories; Logic arrays; Logic circuits; Logic testing; Power dissipation; Voltage control;
Conference_Titel :
Solid-State Circuits Conference, 2002. Digest of Technical Papers. ISSCC. 2002 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-7335-9
DOI :
10.1109/ISSCC.2002.992284
