Title :
Adaptive body bias for reducing impacts of die-to-die and within-die parameter variations on microprocessor frequency and leakage
Author :
Tschanz, J. ; James Kao ; Narendra, S. ; Nair, R. ; Antoniadis, D. ; Chandrakasan, A. ; Vivek De
Author_Institution :
Microprocessor Research Labs, Intel Corporation
Keywords :
Area measurement; CMOS technology; Counting circuits; Detectors; Frequency measurement; Microprocessors; Phase detection; Phase measurement; Semiconductor device measurement; Testing;
Conference_Titel :
Solid-State Circuits Conference, 2002. Digest of Technical Papers. ISSCC. 2002 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-7335-9
DOI :
10.1109/ISSCC.2002.992287
