DocumentCode
2372591
Title
Adaptive body bias for reducing impacts of die-to-die and within-die parameter variations on microprocessor frequency and leakage
Author
Tschanz, J. ; James Kao ; Narendra, S. ; Nair, R. ; Antoniadis, D. ; Chandrakasan, A. ; Vivek De
Author_Institution
Microprocessor Research Labs, Intel Corporation
Volume
2
fYear
2002
fDate
7-7 Feb. 2002
Firstpage
344
Lastpage
539
Keywords
Area measurement; CMOS technology; Counting circuits; Detectors; Frequency measurement; Microprocessors; Phase detection; Phase measurement; Semiconductor device measurement; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 2002. Digest of Technical Papers. ISSCC. 2002 IEEE International
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-7803-7335-9
Type
conf
DOI
10.1109/ISSCC.2002.992287
Filename
992287
Link To Document