DocumentCode :
2372696
Title :
Modified medium voltage arc flash incident energy calculation method
Author :
Wu, Alex Y.
Author_Institution :
Global Eng. Co., Atlanta, GA
fYear :
2008
fDate :
22-27 June 2008
Firstpage :
131
Lastpage :
139
Abstract :
IEEE Standard 1584-2002 provides a guide for conducting arc-flash hazard analyses for low voltage and medium voltage systems. However, users need to be aware that the models in the guide were based on the measurements of arc incident energy under a specific set of test conditions combined with theoretical work. In the medium voltage arc flash analysis, the incident energy calculation, according to the guide, is a function of system voltage, gap between conductors, the distance from the possible arc point to the worker, the bolted three-phase fault and the arc clearing time from the source-side protecting device. However, the effect of fault current decaying was not considered in the current guide. According to IEEE (Institute of Electrical and Electronic Engineers) recommended short circuit calculation method, the fault contributions from generators, induction and synchronous motors would usually decay over the short circuit period based on their short circuit time constants and excitation system. Therefore, the calculated incident energy from short circuit point of view would be higher than the value if the effect of decaying current were considered.
Keywords :
arcs (electric); electric machines; energy measurement; short-circuit currents; arc clearing time; arc flash incident energy calculation method; arc-flash hazard analyses; conductors; generators; induction motors; low voltage systems; medium voltage systems; short circuit calculation method; source-side protecting device; synchronous motors; three-phase fault; Circuit faults; Conductors; Energy measurement; Fault currents; Hazards; Low voltage; Medium voltage; Power engineering and energy; Protection; Testing; Arc clearing time; Arc current; Arc flash analysis; Arc incident energy; decaying three-phase fault current;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pulp and Paper Industry Technical Conference, 2008. PPIC 2008. Conference Record of 2008 54th Annual
Conference_Location :
Seattle, WA
ISSN :
0190-2172
Print_ISBN :
978-1-4244-2524-2
Electronic_ISBN :
0190-2172
Type :
conf
DOI :
10.1109/PAPCON.2008.4585819
Filename :
4585819
Link To Document :
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