Millimeter Wave Devices Based on a 3-D Electromagnetic Band Gap Crystal Manufactured by Layer-By-Layer Ceramic Stereolithography

A 3D Electromagnetic band gap layer-by-layer crystal is studied in the millimeter wave domain. It has been designed and manufactured by 3D ceramic stereolithography with the ceramic material called zircon. Its particular properties have been used to design a high unloaded quality factor cavity (structural defect) localized within this crystal. This cavity has been measured at 30.5 GHz to demonstrate the concept in the millimeter wave domain. This resonant defect has also theoretically been studied while considering a low loss ceramic material such as BZT. It shows that an unloaded Q close to 10 000 can be obtained at this frequency.