Title :
Low-voltage design for portable systems - leakage reduction in digital CMOS circuits
Author_Institution :
Intel Corp.
Keywords :
CMOS digital integrated circuits; CMOS technology; Circuit testing; Design methodology; Frequency; Microarchitecture; Power measurement; Sleep; Subthreshold current; System testing;
Conference_Titel :
Solid-State Circuits Conference, 2002. Digest of Technical Papers. ISSCC. 2002 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-7335-9
DOI :
10.1109/ISSCC.2002.992302
