Title :
Low-voltage design for portable systems - robustness of digital circuits at low voltage
Author_Institution :
Philips
Keywords :
Circuit noise; Circuit testing; Crosstalk; Digital circuits; Integrated circuit noise; Low voltage; Noise level; Noise reduction; Noise robustness; Signal design;
Conference_Titel :
Solid-State Circuits Conference, 2002. Digest of Technical Papers. ISSCC. 2002 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-7335-9
DOI :
10.1109/ISSCC.2002.992303
