Title :
Scanning Photoemission Microscopy of Photo-cathode Surfaces
Author :
Shaw, J.L. ; Yater, J.E. ; Butler, J.E. ; Feldman, D.W. ; Moody, N. ; O´Shea, P.G.
Author_Institution :
Naval Res. Lab.
Abstract :
We describe a scanning photoemission microscope using a focused laser beam. We find the system can provide photoemission images with ~10mum resolution. Images of Cs deposited in local areas on clean p-GaAs showed that the Cs does not move significantly even when heated to 450degC
Keywords :
caesium; gallium arsenide; photocathodes; photoelectron microscopy; photoemission; 450 C; Cs; GaAs; cold cathode; focused laser beam; negative electron affinity; photo-cathode surfaces; photoemission images; scanning photoemission microscopy; Cathodes; Coatings; Electron beams; Free electron lasers; Laser mode locking; Microscopy; Photoelectricity; Pulsed laser deposition; Silicon; Surface emitting lasers; cold cathode; emission microscope; negative electron affinity; photoemission;
Conference_Titel :
Vacuum Electronics Conference, 2006 held Jointly with 2006 IEEE International Vacuum Electron Sources., IEEE International
Conference_Location :
Monterey, CA
Print_ISBN :
1-4244-0108-9
DOI :
10.1109/IVELEC.2006.1666367
