DocumentCode :
2373329
Title :
Research of surface modification on frequency properties of microresonators
Author :
Gaidukov, Gennadiy ; Pagin, Pavel
Author_Institution :
Moscow Inst. of Electron. Eng. (Tech. Univ.), Moscow
fYear :
2008
fDate :
1-5 July 2008
Firstpage :
91
Lastpage :
93
Abstract :
In the article the influence of adsorbed layer on elastic constants and surface stress are considered in MEMS and NEMS. The calculated results are shown on example of silicon resonator. Comparison between theoretical and calculated results is shown.
Keywords :
adsorbed layers; elastic constants; elemental semiconductors; micromechanical resonators; silicon; MEMS; NEMS; Si; adsorbed layer silicon resonator; elastic constants; frequency properties; microresonators; surface modification; surface stress; Equations; Joining processes; Microcavities; Micromechanical devices; Nanoelectromechanical systems; Resonance; Resonant frequency; Silicon; Stress; Structural beams; MEMS; frequency properties; resonance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices and Materials, 2008. EDM 2008. 9th International Workshop and Tutorials on
Conference_Location :
Novosibirsk
ISSN :
1815-3712
Print_ISBN :
978-5-7782-0893-3
Type :
conf
DOI :
10.1109/SIBEDM.2008.4585856
Filename :
4585856
Link To Document :
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