DocumentCode :
2373332
Title :
Repair Policies of Coverage Holes Based Dynamic Node Activation in Wireless Sensor Networks
Author :
Deng, Xiao-heng ; Xu, Chu-Gui ; Zhao, Fu-Yao ; Liu, Yi
Author_Institution :
Sch. of Inf. Sci. & Eng., Central South Univ., Changsha, China
fYear :
2010
fDate :
11-13 Dec. 2010
Firstpage :
368
Lastpage :
371
Abstract :
The failed nodes lead to the phenomenon of coverage holes in Wireless Sensor Networks (WSN), which is due to the exhausted energy or destroyed environment. In this paper, the Best Fit Node Policy (BFNP) is proposed to repair coverage holes of WSN. The main idea of Best Fit Node Policy (BFNP) is that WSN detects the coverage holes when the base station has found the failed nodes of network, and selects the closest inactive node to the center of the minimal coverage circle of the polygon that surrounds the hole and then replaces the failed nodes, meanwhile activates the closest inactive node to repair the coverage holes. The simulation results show that Best Fit Node Policy can maintain better quality of coverage, make higher utilization of energy resources, and extend lifetime of networks. In conclusion, BFNP performs superior to the Coverage Hole Patching Algorithm (CHPA).
Keywords :
quality of service; wireless sensor networks; best fit node policy; coverage holes; dynamic node activation; repair policies; wireless sensor networks; coverage holes; lifetime; repair; wireless sensor networks;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Embedded and Ubiquitous Computing (EUC), 2010 IEEE/IFIP 8th International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-9719-5
Electronic_ISBN :
978-0-7695-4322-2
Type :
conf
DOI :
10.1109/EUC.2010.61
Filename :
5703546
Link To Document :
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