Abstract :
The technical program of this conference included 41 papers from authors in Europe, Asia, and North America covering the topics of yield and critical area, reliability enhancement, defect and fault analysis, testing, concurrent testing, fault diagnosis, fault-tolerance, high level synthesis of reliable systems, yield and reliability issues of analog and mixed signal circuits. There was also a panel session on fault-tolerance
Keywords :
VLSI; concurrent engineering; fault diagnosis; high level synthesis; integrated circuit reliability; integrated circuit testing; integrated circuit yield; mixed analogue-digital integrated circuits; VLSI; analog circuits; concurrent testing; critical area; defect analysis; fault analysis; fault diagnosis; fault-tolerance; high level synthesis; mixed signal circuits; reliability enhancement; yield;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1998. Proceedings., 1998 IEEE International Symposium on
