Title :
A Generalized Time-Domain Waveform Test-Set
Author :
Ferrero, Andrea ; Teppati, Valeria ; Noori, Basim
Author_Institution :
Dept. of Electron., Politec. di Torino corso Duca degli Abruzzi, Turin
Abstract :
This paper addresses the problem of obtaining affordable and fast voltage and current time domain waveforms of non-linear devices, and describes a generalized testing solution which can be applied by anyone in possession of a Vector Network Analyzer (VNA) and a Sampling Oscilloscope of any kind. Some details on the typical issues arising when calibrating such a measurement system are given. Also, a possible calibration solution is described. Finally, a measurement set-up currently in use at Freescale Semiconductor is shown and some measurement examples obtained with this system are given.
Keywords :
calibration; electron device testing; network analysers; oscilloscopes; calibration; generalized time-domain waveform test-set; nonlinear devices; sampling oscilloscope; vector network analyzer; Calibration; Current measurement; Electronic equipment testing; Frequency measurement; Oscilloscopes; Performance evaluation; Sampling methods; Time domain analysis; Time measurement; Tuners;
Conference_Titel :
Microwave Conference, 2008. EuMC 2008. 38th European
Conference_Location :
Amsterdam
Print_ISBN :
978-2-87487-006-4
DOI :
10.1109/EUMC.2008.4751561
