DocumentCode
2373795
Title
Systematic AUED codes for self-checking architectures
Author
Sciuto, Donatella ; Silvano, Cristina ; Stefanelli, Renato
Author_Institution
Dipt. di Elettronica, Politecnico di Milano, Italy
fYear
1998
fDate
2-4 Nov 1998
Firstpage
183
Lastpage
191
Abstract
Encoding techniques and dedicated self-checking architectures can be conveniently adopted in VLSI design to increase fault detection. Area overhead and speed penalty may be traded-off with fault detection capabilities. Aim of this work is to define a class of systematic all-unidirectional error-detecting (AUED) codes suitable for self-checking architectures for multiple output combinational circuits. A class of systematic AUED codes is proposed along with a logic synthesis algorithm to derive the redundant functions directly from the primary inputs. If compared with Berger codes, the proposed encoding techniques require greater output redundancy but provide performance optimization in terms of both transition delays and area overhead
Keywords
CMOS logic circuits; VLSI; combinational circuits; delays; error detection codes; fault diagnosis; integrated circuit testing; logic testing; redundancy; CMOS; VLSI design; all-unidirectional error-detecting codes; area overhead; fault detection; fault detection capabilities; logic synthesis algorithm; multiple output combinational circuits; performance optimization; primary inputs; redundant functions; self-checking architectures; speed penalty; systematic AUED codes; transition delays; Circuit faults; Circuit synthesis; Combinational circuits; Encoding; Equations; Fault detection; Logic; Read only memory; Redundancy; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 1998. Proceedings., 1998 IEEE International Symposium on
Conference_Location
Austin, TX
ISSN
1550-5774
Print_ISBN
0-8186-8832-7
Type
conf
DOI
10.1109/DFTVS.1998.732165
Filename
732165
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