Title :
Systematic AUED codes for self-checking architectures
Author :
Sciuto, Donatella ; Silvano, Cristina ; Stefanelli, Renato
Author_Institution :
Dipt. di Elettronica, Politecnico di Milano, Italy
Abstract :
Encoding techniques and dedicated self-checking architectures can be conveniently adopted in VLSI design to increase fault detection. Area overhead and speed penalty may be traded-off with fault detection capabilities. Aim of this work is to define a class of systematic all-unidirectional error-detecting (AUED) codes suitable for self-checking architectures for multiple output combinational circuits. A class of systematic AUED codes is proposed along with a logic synthesis algorithm to derive the redundant functions directly from the primary inputs. If compared with Berger codes, the proposed encoding techniques require greater output redundancy but provide performance optimization in terms of both transition delays and area overhead
Keywords :
CMOS logic circuits; VLSI; combinational circuits; delays; error detection codes; fault diagnosis; integrated circuit testing; logic testing; redundancy; CMOS; VLSI design; all-unidirectional error-detecting codes; area overhead; fault detection; fault detection capabilities; logic synthesis algorithm; multiple output combinational circuits; performance optimization; primary inputs; redundant functions; self-checking architectures; speed penalty; systematic AUED codes; transition delays; Circuit faults; Circuit synthesis; Combinational circuits; Encoding; Equations; Fault detection; Logic; Read only memory; Redundancy; Very large scale integration;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1998. Proceedings., 1998 IEEE International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
0-8186-8832-7
DOI :
10.1109/DFTVS.1998.732165