Can the current behavior of faulty and fault-free ICs and the impact on diagnosis

Author

Thibeault, C. ; Boisvert, L.

Author_Institution

Dept. of Electr. Eng., Ecole de Technol. Superieure, Montreal, Que., Canada

fYear

1998

fDate

2-4 Nov 1998

Firstpage

202

Lastpage

210

Abstract

The purpose of this paper is to analyze the current behavior of faulty and fault free integrated circuits (ICs) and its impact on diagnosis. More specifically, we first show that normal sub-threshold current can be modeled by a Gaussian distribution. Then, we investigate faulty IC current variations caused to the load connected to nodes involved in bridging faults. Finally, we propose some modifications to a diagnosis method based on maximum likelihood estimation to deal with these behaviors

Keywords

CMOS integrated circuits; Gaussian distribution; VLSI; fault diagnosis; integrated circuit testing; maximum likelihood estimation; CMOS; Gaussian distribution; bridging faults; current behavior; fault diagnosis; fault-free ICs; faulty; maximum likelihood estimation; sub-threshold current; Circuit faults; Circuit testing; Fault diagnosis; Gaussian distribution; Histograms; Integrated circuit modeling; Integrated circuit testing; Maximum likelihood estimation; Robustness; Subthreshold current;

fLanguage

English

Publisher

ieee

Conference_Titel

Defect and Fault Tolerance in VLSI Systems, 1998. Proceedings., 1998 IEEE International Symposium on

Conference_Location

Austin, TX

ISSN

1550-5774

Print_ISBN

0-8186-8832-7

Type

conf

DOI

10.1109/DFTVS.1998.732167

Filename

732167