DocumentCode
2373958
Title
Permeameter For The Characterization Of Magnetic Thin Films Up To 15 GHz
Author
Hettstedt, Falk ; Schürmann, Ulrich ; Knöchel, Reinhard ; Quandt, Eckhard
Author_Institution
Inst. of Electr. & Inf. Eng., Christian-Albrechts-Univ., Kiel
fYear
2008
fDate
27-31 Oct. 2008
Firstpage
797
Lastpage
800
Abstract
This paper presents a new permeameter for measurement of the complex permeability mu of magnetic thin films up to 15 GHz. The permeameter consists of a strip conductor, which acts as an inductor and is loaded with the magnetic material. The geometry is optimized with respect to sensitivity and self resonance by field simulations using HFSS. A new wideband calibration procedure up to the self resonance frequency of the fixture is also outlined. It utilizes a reference material with known permeability, where the ferromagnetic resonance is shifted by an external magnetic DC field. Frequency dependent calibration factors are introduced. Small residual errors at low frequencies are removed through vibrating sample magnetometer measurements.
Keywords
calibration; ferromagnetic materials; ferromagnetic resonance; finite element analysis; magnetic permeability measurement; magnetic thin films; magnetometers; measurement errors; microwave measurement; HFSS; complex permeability; ferromagnetic resonance; field simulation; magnetic DC field; magnetic material; magnetic thin films; permeameter; residual errors; self resonance; strip conductor; vibrating sample magnetometer measurement; Calibration; Conducting materials; Geometry; Magnetic field measurement; Magnetic films; Magnetic materials; Magnetic resonance; Permeability measurement; Strips; Thin film inductors;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 2008. EuMC 2008. 38th European
Conference_Location
Amsterdam
Print_ISBN
978-2-87487-006-4
Type
conf
DOI
10.1109/EUMC.2008.4751573
Filename
4751573
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