Title :
eDSPlab: A remote-accessed instrumentation laboratory for digital signal processors training based on the Internet
Author :
Gallardo, Sergio ; Barrero, Federico ; Toral, S.L. ; Duran, J.
Author_Institution :
Dept. of Electron. Eng., Seville Univ.
Abstract :
This paper presents a new model for using real instrumentation laboratories for digital signal processors (DSP) training on the Internet employing a virtual environment based on Labview. Remote instrumentation interest has been growing immensely as a result of the telecommunication network development and middleware technologies, specially remote signal processing instrumentation/systems used in both industrial and educational approaches. In engineering education, a key activity to be improved is the learning process in digital signal processing instrumentation. Industrial development also demands network distributed and remote applications for on-line control and off-presence monitoring. A remote-accessed instrumentation laboratory is proposed in this approach versus simulation and software-based tools. The virtual on-line laboratory has been developed and validated in the field of electronic digital measurement processing and the effectiveness of the approach is experimentally verified locally and remotely. The prototype has been successfully implemented during the last course 2004/2005 at the Electronic Engineering Department of the University of Seville, Spain
Keywords :
Internet; computer aided instruction; digital signal processing chips; electronic engineering education; middleware; software tools; virtual instrumentation; DSP; Internet; digital signal processors training; eDSPlab; engineering education; middleware; off-presence monitoring; on-line control; remote instrumentation; remote-accessed instrumentation laboratory; software-based tools; telecommunication network development; virtual on-line laboratory; Digital signal processing; Digital signal processors; Educational technology; Electrical equipment industry; Industrial training; Instruments; Internet; Laboratories; Middleware; Virtual environment; DSP; ICT; Instrumentation; LabVIEW; embedded system; middleware; network; remote lab;
Conference_Titel :
IEEE Industrial Electronics, IECON 2006 - 32nd Annual Conference on
Conference_Location :
Paris
Print_ISBN :
1-4244-0390-1
DOI :
10.1109/IECON.2006.347780