Title :
BIST module for mixed-signal circuits
Author :
Demidenko, S. ; Piuri, V. ; Yarmolik, V. ; Shmidman, A.
Abstract :
T-flip-flop implementation of the universal module (signature analyzer and test generator) for built-in self-test of mixed signal circuits is proposed and analyzed
Keywords :
built-in self test; flip-flops; integrated circuit testing; logic analysers; mixed analogue-digital integrated circuits; BIST module; T-flip-flop implementation; built-in self-test; mixed-signal circuits; signature analyzer; test generator; universal module; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Cybernetics; Electronic equipment testing; Hardware; Information analysis; Registers; Signal analysis;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1998. Proceedings., 1998 IEEE International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
0-8186-8832-7
DOI :
10.1109/DFTVS.1998.732185
