DocumentCode
2374240
Title
BIST module for mixed-signal circuits
Author
Demidenko, S. ; Piuri, V. ; Yarmolik, V. ; Shmidman, A.
fYear
1998
fDate
2-4 Nov 1998
Firstpage
349
Lastpage
352
Abstract
T-flip-flop implementation of the universal module (signature analyzer and test generator) for built-in self-test of mixed signal circuits is proposed and analyzed
Keywords
built-in self test; flip-flops; integrated circuit testing; logic analysers; mixed analogue-digital integrated circuits; BIST module; T-flip-flop implementation; built-in self-test; mixed-signal circuits; signature analyzer; test generator; universal module; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Cybernetics; Electronic equipment testing; Hardware; Information analysis; Registers; Signal analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 1998. Proceedings., 1998 IEEE International Symposium on
Conference_Location
Austin, TX
ISSN
1550-5774
Print_ISBN
0-8186-8832-7
Type
conf
DOI
10.1109/DFTVS.1998.732185
Filename
732185
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