Author index

fYear

1998

fDate

4-4 Nov. 1998

Firstpage

355

Lastpage

355

Abstract

The author index contains an entry for each author and coauthor included in the proceedings record.

fLanguage

English

Publisher

ieee

Conference_Titel

Defect and Fault Tolerance in VLSI Systems, 1998. Proceedings., 1998 IEEE International Symposium on

Conference_Location

Austin, TX, USA

ISSN

1550-5774

Print_ISBN

0-8186-8832-7

Type

conf

DOI

10.1109/DFTVS.1998.732186

Filename

732186

Link To Document