• DocumentCode
    2374289
  • Title

    Calculated orientations and aspect ratios of stiffened rectangular support systems of SC-cut quartz resonators which minimize the influence of fabrication imperfections on acceleration sensitivity

  • Author

    Zhou, Y.S. ; Tiersten, H.F.

  • Author_Institution
    Dept. of Mech. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
  • fYear
    1993
  • fDate
    2-4 Jun 1993
  • Firstpage
    442
  • Lastpage
    447
  • Abstract
    Existing computer programs are used in the calculation of rectangular support orientations and aspect ratios to minimize the influence of fabrication imperfections on the resultant acceleration sensitivity of stiffened rectangular support systems of SC-cut quartz resonators. Both contoured and flat-plate trapped energy resonators are treated. The shorter distance between the sidewalls is established by a criterion associated with the energy in the mode shape for each particular harmonic. Results are presented for a range of energy criteria and a number of contoured and flat-plate resonators. Although the square plate never yields good results, optimal and near-optimal results are obtained for aspect ratios considerably less than 2.0. Indeed, it is shown that an aspect ratio of 1.5 consistently yields optimum or near-optimum results. However, the orientation of the support rectangle varies significantly from one resonator to another
  • Keywords
    acceleration; crystal resonators; electronic engineering computing; quartz; SC-cut quartz resonators; SiO2; acceleration sensitivity; aspect ratios; computer programs; contoured resonator; fabrication imperfections; flat-plate trapped energy resonators; harmonic; mode shape; rectangular support orientations; stiffened rectangular support systems; Acceleration; Aerospace engineering; Fabrication; Mechanical engineering; Nonlinear equations; Performance analysis; Shape;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 1993. 47th., Proceedings of the 1993 IEEE International
  • Conference_Location
    Salt Lake City, UT
  • Print_ISBN
    0-7803-0905-7
  • Type

    conf

  • DOI
    10.1109/FREQ.1993.367431
  • Filename
    367431