DocumentCode
2374317
Title
Single bridging fault diagnosis for CMOS circuits
Author
Olson, Michael ; Sun, Xiaoling
Author_Institution
Dept. of Electr. & Comput. Eng., Alberta Univ., Edmonton, Alta., Canada
Volume
2
fYear
1997
fDate
25-28 May 1997
Firstpage
732
Abstract
This paper presents a new algorithm for diagnosing gate level bridging faults in CMOS circuits. The algorithm employs a single fault assumption, and produces a significantly higher diagnostic resolution than that provided by previous algorithms. Extensive computer simulations are performed to illustrate the merits and feasibility of the new algorithm using the ISCAS85 benchmark circuits
Keywords
CMOS logic circuits; circuit analysis computing; fault diagnosis; integrated circuit design; logic CAD; logic testing; CMOS circuits; ISCAS85 benchmark circuits; computer simulations; diagnostic resolution; gate level bridging faults; single bridging fault diagnosis; single fault assumption; Bridge circuits; CMOS logic circuits; Circuit faults; Circuit simulation; Circuit testing; Fault diagnosis; Feedback circuits; Logic circuits; Logic testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical and Computer Engineering, 1997. Engineering Innovation: Voyage of Discovery. IEEE 1997 Canadian Conference on
Conference_Location
St. Johns, Nfld.
ISSN
0840-7789
Print_ISBN
0-7803-3716-6
Type
conf
DOI
10.1109/CCECE.1997.608344
Filename
608344
Link To Document