Title :
Single bridging fault diagnosis for CMOS circuits
Author :
Olson, Michael ; Sun, Xiaoling
Author_Institution :
Dept. of Electr. & Comput. Eng., Alberta Univ., Edmonton, Alta., Canada
Abstract :
This paper presents a new algorithm for diagnosing gate level bridging faults in CMOS circuits. The algorithm employs a single fault assumption, and produces a significantly higher diagnostic resolution than that provided by previous algorithms. Extensive computer simulations are performed to illustrate the merits and feasibility of the new algorithm using the ISCAS85 benchmark circuits
Keywords :
CMOS logic circuits; circuit analysis computing; fault diagnosis; integrated circuit design; logic CAD; logic testing; CMOS circuits; ISCAS85 benchmark circuits; computer simulations; diagnostic resolution; gate level bridging faults; single bridging fault diagnosis; single fault assumption; Bridge circuits; CMOS logic circuits; Circuit faults; Circuit simulation; Circuit testing; Fault diagnosis; Feedback circuits; Logic circuits; Logic testing; Voltage;
Conference_Titel :
Electrical and Computer Engineering, 1997. Engineering Innovation: Voyage of Discovery. IEEE 1997 Canadian Conference on
Conference_Location :
St. Johns, Nfld.
Print_ISBN :
0-7803-3716-6
DOI :
10.1109/CCECE.1997.608344
