Title :
Semiconductor Nonlinearities For Optical Limiting
Author :
Van Stryland, E.W. ; Hagan, D.J. ; Sheik-Bahae, M. ; Hutchings, D.C. ; Soileau, M.J.
Author_Institution :
University of Central Florida
Keywords :
Absorption; Nonlinear optical devices; Nonlinear optics; Optical materials; Optical refraction; Optical sensors; Predictive models; Semiconductor materials; Wavelength measurement; Zinc compounds;
Conference_Titel :
Nonlinear Optics: Materials, Phenomena and Devices, 1990. Digest. NLO '90.
Conference_Location :
Kauai, HI, USA
DOI :
10.1109/NLO.1990.695971
