Frequency temperature characteristics of the x-length strip resonators of AT-cut quartz

Author

Zelenka, J. ; Lee, P.C.Y.

Author_Institution

Dept. of Electr. Eng., Tech. Univ. of Liberec, Czech Republic

fYear

1993

fDate

2-4 Jun 1993

Firstpage

523

Lastpage

526

Abstract

The equations of motion of coupled thickness-shear, thickness-length flexure, and width-shear and width-length flexure derived by neglecting the piezoelectric coupling [derived from a system of one-dimensional equations of motion for AT-cut quartz strip resonators (Lee and Wang, 1992)] are used to study the frequency temperature characteristics of x-length AT-cut quartz strip resonators. The computed dispersion curves, frequency spectrum, and thickness-shear resonance frequency-temperature curves are given (the last two as a function of dimension ratios)

Keywords

crystal resonators; dispersion relations; piezoelectric oscillations; quartz; AT-cut quartz strip resonators; SiO₂; dispersion curves; equations of motion; frequency spectrum; frequency-temperature characteristics; piezoelectric coupling; thickness-length flexure; thickness-shear flexure; thickness-shear resonance; width-length flexure; width-shear flexure; x-length strip resonators; Civil engineering; Equations; Material properties; Operations research; Resonance; Resonant frequency; Strips; Temperature dependence; Thermal expansion; Vibrations;

fLanguage

English

Publisher

ieee

Conference_Titel

Frequency Control Symposium, 1993. 47th., Proceedings of the 1993 IEEE International

Conference_Location

Salt Lake City, UT

Print_ISBN

0-7803-0905-7

Type

conf

DOI

10.1109/FREQ.1993.367439

Filename

367439