DocumentCode :
2374836
Title :
Serial reconstruction and montaging from large-field electron microscope tomograms
Author :
Phan, Sébastien ; Terada, Masako ; Lawrence, Albert
Author_Institution :
Nat. Center For Microscopy & Imaging Res., Univ. of California, La Jolla, CA, USA
fYear :
2009
fDate :
3-6 Sept. 2009
Firstpage :
5772
Lastpage :
5776
Abstract :
Electron microscope tomography has been proven as an essential technique for imaging the structure of cells beyond the range of the light microscope down to the molecular level. However, because of the extreme difference in spatial scales, there is a large gap to be bridged between light and electron microscopy. Various techniques have been developed, including increasing size of the sensor arrays, serial sectioning and montaging. Data sets and reconstructions obtained by the latter techniques generate many 3D reconstructions that need to be glued together to provide information at a larger spatial scale. However, during the course of data acquisition, thin slices may become warped in optical and electron microscope preparations. We review some procedures for de-warping sections and reassembling them into larger reconstructions, and present some data from electron microscopy.
Keywords :
cellular biophysics; data acquisition; electron microscopy; image reconstruction; medical image processing; tomography; 3D reconstructions; cellular structure; data acquisition; electron microscope tomography; electron microscopy; light microscopy; montaging; sensor arrays; serial reconstruction; serial sectioning; Algorithms; Image Enhancement; Image Interpretation, Computer-Assisted; Microscopy, Electron; Pattern Recognition, Automated; Sensitivity and Specificity; Subtraction Technique; Tomography, Optical;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2009. EMBC 2009. Annual International Conference of the IEEE
Conference_Location :
Minneapolis, MN
ISSN :
1557-170X
Print_ISBN :
978-1-4244-3296-7
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/IEMBS.2009.5332531
Filename :
5332531
Link To Document :
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