Title :
Characterizing sampling aperture of clocked comparators
Author :
Jeeradit, M. ; Kim, J. ; Leibowitz, B. ; Nikaeen, P. ; Wang, V. ; Garlepp, B. ; Werner, C.
Author_Institution :
Rambus Inc., Los Altos, CA
Abstract :
Practical simulation and measurement methods based on impulse sensitivity functions to characterize the sampling aperture of clocked comparators are demonstrated on a 90 nm CMOS testchip. The results comparing a StrongARM latch and a CML latch suggest that the StrongARM latch has a narrower aperture of 23 ps but its aperture center is more sensitive to supply (65 ps/V). The CML latch has a higher sampling gain of 88.8 dB but a lower bandwidth of 6.8 GHz.
Keywords :
CMOS logic circuits; clocks; comparators (circuits); flip-flops; CML latch; CMOS testchip; StrongARM latch; clocked comparators; impulse sensitivity functions; sampling aperture; size 90 nm; Apertures; Bandwidth; Clocks; Equations; Latches; Metastasis; Sampling methods; Time measurement; Voice mail; Voltage; aperture and impulse sensitivity function; comparator;
Conference_Titel :
VLSI Circuits, 2008 IEEE Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-1804-6
Electronic_ISBN :
978-1-4244-1805-3
DOI :
10.1109/VLSIC.2008.4585955
