DocumentCode
2375181
Title
Automated epilepsy diagnosis using interictal scalp EEG
Author
Bao, Forrest Sheng ; Gao, Jue-Ming ; Hu, Jing ; Lie, Donald Y C ; Zhang, Yuanlin ; Oommen, K.J.
Author_Institution
Dept. of Electr. & Comput. Eng., Texas Tech Univ., Lubbock, TX, USA
fYear
2009
fDate
3-6 Sept. 2009
Firstpage
6603
Lastpage
6607
Abstract
Over 50 million people worldwide suffer from epilepsy. Traditional diagnosis of epilepsy relies on tedious visual screening by highly trained clinicians from lengthy EEG recording that contains the presence of seizure (ictal) activities. Nowadays, there are many automatic systems that can recognize seizure-related EEG signals to help the diagnosis. However, it is very costly and inconvenient to obtain long-term EEG data with seizure activities, especially in areas short of medical resources. We demonstrate in this paper that we can use the interictal scalp EEG data, which is much easier to collect than the ictal data, to automatically diagnose whether a person is epileptic. In our automated EEG recognition system, we extract three classes of features from the EEG data and build probabilistic neural networks (PNNs) fed with these features. We optimize the feature extraction parameters and combine these PNNs through a voting mechanism. As a result, our system achieves an impressive 94.07% accuracy.
Keywords
biomechanics; diseases; electroencephalography; feature extraction; medical disorders; neural nets; neurophysiology; patient diagnosis; probability; seizure; automated EEG recognition system; automated epilepsy diagnosis; feature extraction parameters; ictal activity; interictal scalp EEG; probabilistic neural networks; seizure activity; voting mechanism; Electroencephalogram (EEG); Epilepsy; Probabilistic Neural Network (PNN); seizure; Automation; Electroencephalography; Epilepsy; Fourier Analysis; Fractals; Humans; Neural Networks (Computer); Scalp;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2009. EMBC 2009. Annual International Conference of the IEEE
Conference_Location
Minneapolis, MN
ISSN
1557-170X
Print_ISBN
978-1-4244-3296-7
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2009.5332550
Filename
5332550
Link To Document