DocumentCode :
237528
Title :
Structural and electrical properties of modified CMOS device under radiation environment in designing of voltage control oscillator (VCO)
Author :
Jain, C.P.
Author_Institution :
Dept. of Electron., Banasthali Univ., Jaipur, India
fYear :
2014
fDate :
28-29 Nov. 2014
Firstpage :
379
Lastpage :
383
Abstract :
This paper shows the structural CMOS with and without radiation and variation of electrical properties of device under various radiations doses and proposes a modified CMOS circuit which mitigates radiation effect by improving switch point in I-V characteristic. In order to redesign the circuit for radiation resistance; the above radiation hardened inverter circuit is used to design the Voltage Controlled Oscillator using Radiation Hardened By Design (RDBD) technique. The circuit exhibits only minimal degradation with total dose when irradiated.
Keywords :
CMOS analogue integrated circuits; integrated circuit design; invertors; radiation hardening (electronics); voltage-controlled oscillators; I-V characteristic; RDBD technique; VCO; electrical properties; modified CMOS device; radiation effect mitigation; radiation environment; radiation hardened by design technique; radiation hardened inverter circuit; radiation resistance; radiations doses; structural properties; switch point; voltage control oscillator design; CMOS integrated circuits; Inverters; Radiation hardening (electronics); Transistors; Voltage control; Voltage-controlled oscillators; Radiation Hardened By Design (RHBD); Voltage Controlled Oscillators (VCO); single event transients; total ionizing dose;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computational Intelligence on Power, Energy and Controls with their impact on Humanity (CIPECH), 2014 Innovative Applications of
Conference_Location :
Ghaziabad
Type :
conf
DOI :
10.1109/CIPECH.2014.7019063
Filename :
7019063
Link To Document :
بازگشت