• DocumentCode
    2375281
  • Title

    Closed loop tests of the NASA sapphire phase stabilizer

  • Author

    Santiago, David G. ; Dick, G. John

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • fYear
    1993
  • fDate
    2-4 Jun 1993
  • Firstpage
    774
  • Lastpage
    778
  • Abstract
    A cryogenic sapphire phase stabilizer (SPS) has been developed to meet microwave oscillator phase noise requirements. The SPS uses a high-Q, X-band sapphire dielectric whispering-gallery mode resonator as a discriminator to stabilize a quartz crystal oscillator. At an untuned frequency of 7.9449 GHz with a loaded Q of 6 million, an "open loop" discriminator noise floor (referred to 100 MHz) of approximately Sphi(f) = -110 dB/f3(/Hz) was previously reported for offset frequencies from 1 Hz to 1 kHz. Precise tuning of the sapphire resonant frequency now allows implementation of simplified control loops together with suppressed-carrier phase sensing circuitry. These improvements make possible an ultralow-noise demonstration of closed-loop SPS performance. From 1 Hz to 1 kHz a comparison of the SPS with a quartz crystal reference oscillator of the highest quality showed only the noise of the reference oscillator. These results appear to represent the lowest phase noise in a closed-loop or active sapphire oscillator to date at temperatures achievable with liquid nitrogen (77 K or higher)
  • Keywords
    Q-factor; circuit tuning; cryogenic electronics; dielectric resonator oscillators; microwave oscillators; phase noise; sapphire; 7.9449 GHz; 77 K; Al2O3; Q-factor; X-band sapphire dielectric whispering-gallery mode resonator; closed loop test; closed-loop SPS performance; cryogenic sapphire phase stabilizer; liquid N temperature; microwave oscillator phase noise requirements; open loop discriminator noise floor; quartz crystal oscillator; reference oscillator; sapphire resonant frequency; suppressed-carrier phase sensing circuitry; tuning; Circuit optimization; Cryogenics; Dielectrics; Microwave oscillators; NASA; Phase noise; RLC circuits; Resonant frequency; Testing; Whispering gallery modes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 1993. 47th., Proceedings of the 1993 IEEE International
  • Conference_Location
    Salt Lake City, UT
  • Print_ISBN
    0-7803-0905-7
  • Type

    conf

  • DOI
    10.1109/FREQ.1993.367476
  • Filename
    367476