Title :
X ray topography study of gallium phosphate crystals and resonators
Author :
Capelle, B. ; Zarka, A. ; Schwartzel, J. ; Detaint, J. ; Zheng, Y. ; Ibanez, A. ; Philippot, E.
Author_Institution :
LMCP Univ. P VI et P VII, CNRS, Paris, France
Abstract :
Using the synchrotron radiation delivered by the DCI storage ring at LURE (Orsay, France), the X-ray topography technique was used to study the crystalline perfection of GaPO4 samples grown under different conditions. The growth of gallium phosphate on a berlinite seed is analyzed by X-ray section topography. The results obtained demonstrate the feasibility of gallium phosphate epitaxy on large berlinite seeds in a sulphuric acid medium. These first characterizations indicate the good quality of gallium phosphate epitaxy on berlinite seeds. This method is a good solution for obtaining gallium phosphate crystals of good quality and large sizes. Different vibration modes of approximately rhombohedral face cut and near AT cut thickness shear resonators were observed
Keywords :
X-ray topography; crystal growth from solution; crystal resonators; gallium compounds; liquid phase epitaxial growth; piezoelectric materials; surface topography; AT cut thickness shear resonators; AlPO4; DCI storage ring; GaPO4; H2SO4; X-ray section topography; X-ray topography technique; berlinite seed; crystalline perfection; epitaxial growth; synchrotron radiation; vibration modes; Crystalline materials; Crystals; Diffraction; Epitaxial growth; Molecular beam epitaxial growth; Piezoelectric materials; Storage rings; Surfaces; Temperature sensors; X-ray imaging;
Conference_Titel :
Frequency Control Symposium, 1993. 47th., Proceedings of the 1993 IEEE International
Conference_Location :
Salt Lake City, UT
Print_ISBN :
0-7803-0905-7
DOI :
10.1109/FREQ.1993.367481
