• DocumentCode
    2375393
  • Title

    Experience of Design and Prototyping of a Multi-Biometric Early Warning Physical Access Control Security System (PASS) and a Training System (T-PASS)

  • Author

    Yanushkevich, S.N. ; Stoica, A. ; Shmerko, V.P.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Calgary Univ., Alta.
  • fYear
    2006
  • fDate
    6-10 Nov. 2006
  • Firstpage
    2347
  • Lastpage
    2352
  • Abstract
    This paper presents a concept of biometric-based early-warning and intelligent support for physical access security system (PASS). The early warning principle exploits the real-time analysis of the biometrics of the individual being scanned. Binding all sources of information into an objective supported by intelligence tools not only provides for reliable identification of an individual, but also supplies data for situational awareness and risk management support. An intelligent approach serves for interpretation of biometric data in semantic form, as well as dialogue support between the officer and the customer. The training-extended PASS (T-PASS) is built on the PASS, and aims at assisting the security personnel in developing decision making skills. The PASS and T-PASS are directed at a wide spectrum of applications such as immigration service and border control airports, seaports, border-crossing, security of important public events, hospitals and banking
  • Keywords
    biometrics (access control); decision making; risk management; biometric-based early-warning; border control airports; border-crossing; intelligent approach; intelligent support; physical access control security system; public event security; real-time analysis; risk management support; seaports; training system; Access control; Bioinformatics; Biometrics; Data security; Decision making; Information resources; Information security; Personnel; Prototypes; Risk management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IEEE Industrial Electronics, IECON 2006 - 32nd Annual Conference on
  • Conference_Location
    Paris
  • ISSN
    1553-572X
  • Print_ISBN
    1-4244-0390-1
  • Type

    conf

  • DOI
    10.1109/IECON.2006.347949
  • Filename
    4153570