DocumentCode
2375579
Title
Visual exploration of genetic association with voxel-based imaging phenotypes in an MCI/AD study
Author
Kim, Sungeun ; Shen, Li ; Saykin, Andrew J. ; West, John D.
fYear
2009
fDate
3-6 Sept. 2009
Firstpage
3849
Lastpage
3852
Abstract
Neuroimaging genomics is a new transdisciplinary research field, which aims to examine genetic effects on brain via integrated analyses of high throughput neuroimaging and genomic data. We report our recent work on developing an imaging genomic browsing system that allows for whole genome and entire brain analyses based on visual exploration and (2) applying the system to the imaging genomic analysis of an existing MCI/AD cohort. Voxel-based morphometry is used to define imaging phenotypes. ANCOVA is employed to evaluate the effect of the interaction of genotypes and diagnosis in relation to imaging phenotypes while controlling for relevant covariates. Encouraging experimental results suggest that the proposed system has substantial potential for enabling discovery of imaging genomic associations through visual evaluation and for localizing candidate imaging regions and genomic regions for refined statistical modeling.
Keywords
biomedical MRI; brain; cognition; covariance analysis; diseases; genetics; genomics; medical image processing; ANCOVA; Alzheimer´s disease; covariate analysis; data preprocessing; genetic effects; genomic browsing system; magnetic resonance imaging; mild cognitive impairment; neuroimaging genomics; statistical modeling; visual exploration; voxel-based imaging phenotypes; voxel-based morphometry; Imaging genomics; genome-wide association study; visual exploration; voxel-based morphometry; Aged; Aging; Alzheimer Disease; Artificial Intelligence; Brain Mapping; Cognition Disorders; Cohort Studies; Computer Graphics; Diagnostic Imaging; Genome-Wide Association Study; Genomics; Humans; Neurons; Pattern Recognition, Automated; Phenotype;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2009. EMBC 2009. Annual International Conference of the IEEE
Conference_Location
Minneapolis, MN
ISSN
1557-170X
Print_ISBN
978-1-4244-3296-7
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2009.5332570
Filename
5332570
Link To Document