DocumentCode :
2375632
Title :
Environmental stress screening experiment using the Taguchi method
Author :
Pachucki, Dennis E.
Author_Institution :
Sun Microsyst. Comput. Corp., Sunnyvale, CA, USA
fYear :
1994
fDate :
1-4 May 1994
Firstpage :
1028
Lastpage :
1036
Abstract :
Sun Microsystems has strived to be a leader in the workstation market. To maintain and advance in this leadership role, manufacturing process improvements which increase productivity, decrease test process time, and improve customer satisfaction are being pursued. The application of environmental stress screening is a method of achieving these improvements This experiment identifies the significance or relevancy of the selected stress screens for application in the PWA production process by using a statistically significant controlled method. The design of experiments statistical approach (analysis of variance), is applied, combined with the Taguchi two-level, seven-factor design method. This experiment concentrated on three stresses, (temperature cycling, random vibration, power cycling) and two diagnostic levels (a prom- based power-on self test-POST, and a functional test suite-Sundiag). Note that this is not an optimization experiment. Once the significance to the production process is identified, future optimizing of temperature cycling, power cycling, and vibration screens will be conducted. Also, voltage margining is not included so as to reduce the complexity of the experiment-treatment factors and interactions
Keywords :
design of experiments; environmental stress screening; environmental testing; production testing; statistical analysis; workstations; POST; PWA production; Sun Microsystems; Sundiag; Taguchi method; customer satisfaction; design of experiments; diagnostic levels; environmental stress screening; functional test; manufacturing process; power cycling; productivity; prom-based power-on self test; random vibration; statistical approach; temperature cycling; test process time; two-level seven-factor design; variance analysis; workstation; Automatic testing; Customer satisfaction; Design methodology; Manufacturing processes; Production; Productivity; Stress; Sun; Temperature; Workstations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1994. Proceedings., 44th
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-0914-6
Type :
conf
DOI :
10.1109/ECTC.1994.367501
Filename :
367501
Link To Document :
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