DocumentCode
2375931
Title
Characterization and reduction of simultaneous switching noise for a multilayer package
Author
Hirano, Naohiko ; Miura, Masayuki ; Hiruta, Yoichi ; Sudo, Toshio
Author_Institution
Semicond. Device Eng. Lab., Toshiba Corp., Kawasaki, Japan
fYear
1994
fDate
1-4 May 1994
Firstpage
949
Lastpage
956
Abstract
This paper reports a test chip and an experimental method for characterizing the simultaneous switching noise (SSN) and the noise dependency on the ground pin assignment of a multilayer package. The SSN measurement was executed for various ground pin assignments. The measured results demonstrated that an extra electric current path of the displaced ground pin assignment enhanced the ground bounce due to increasing the effective inductance of package. A balanced pin assignment of the ground pins which suppressed the extra current path in the ground plane had a 20% reduction effect for SSN compared with conventional pin assignments. The extra current path of the ground plane was also verified by an electromagnetic field simulation. The modeling procedure was established for the noise estimation using the inductance value estimated by the field simulation. The circuit simulation resulted in a good agreement with the measured results, and the noise simulation method was applicable for the noise estimation at earlier stage of the package design
Keywords
circuit analysis computing; inductance; integrated circuit modelling; integrated circuit noise; integrated circuit packaging; integrated circuit testing; interference suppression; circuit simulation; electromagnetic field simulation; ground bounce; ground pin assignment; modeling procedure; multilayer package; noise dependency; package inductance; simultaneous switching noise; Circuit noise; Circuit simulation; Current measurement; Electric variables measurement; Inductance measurement; Noise reduction; Nonhomogeneous media; Packaging; Semiconductor device measurement; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1994. Proceedings., 44th
Conference_Location
Washington, DC
Print_ISBN
0-7803-0914-6
Type
conf
DOI
10.1109/ECTC.1994.367514
Filename
367514
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