• DocumentCode
    2376135
  • Title

    An integrated and improved dispatching approach to reduce cycle time of wet etch and furnace operations in semiconductor fabrication

  • Author

    Chang, Chia-Yu ; Chang, Kuo-Hao

  • Author_Institution
    Dept. of Ind. Eng. & Eng. Manage., Nat. Tsing Hua Univ., Hsinchu, Taiwan
  • fYear
    2012
  • fDate
    23-25 May 2012
  • Firstpage
    734
  • Lastpage
    741
  • Abstract
    The dispatching rules for the process of wet etch and furnace are complex due to the multiple considerations of waiting time constraints, batch size forming, and load balancing. This paper proposes an effective three-stage approach based on multi-factors selection, integrating developed dispatching rules and LR-ratio method, to decide the most appropriate scheduler and sequencing order. To verify the viability of the proposed approach, we conduct an empirical study based on real data collected in a semiconductor manufacturing. A simulation model is constructed and the proposed method is applied for evaluating its performance. Numerical results show that the developed approach can significantly reduce the cycle time by 8% compared to the existing approach.
  • Keywords
    batch processing (industrial); dispatching; etching; furnaces; lead time reduction; order processing; scheduling; semiconductor device manufacture; LR ratio method; batch size forming; cycle time reduction; dispatching rules; furnace operations; load balancing; order sequencing; scheduler; semiconductor fabrication; semiconductor manufacturing; waiting time constraints; wet etch process; Argon; Furnaces; Numerical models; Batch size; Dispatching rules; Scheduling; Sequencing; Simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Supported Cooperative Work in Design (CSCWD), 2012 IEEE 16th International Conference on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4673-1211-0
  • Type

    conf

  • DOI
    10.1109/CSCWD.2012.6221901
  • Filename
    6221901