Title : 
Bounded-Depth Circuits Cannot Sample Good Codes
         
        
            Author : 
Lovett, Shachar ; Viola, Emanuele
         
        
            Author_Institution : 
Sch. of Math., Inst. of Adv. Study, Princeton, NJ, USA
         
        
        
        
        
        
            Abstract : 
We study a variant of the classical circuit-lower-bound problems: proving lower bounds for sampling distributions given random bits. We prove a lower bound on the statistical distance between (i) the output distribution of any small constant-depth (a.k.a. AC0) circuit, and (ii) the uniform distribution over any code that is ``good´´, i.e. has constant relative distance and rate. This seems to be the first lower bound of this kind. We give two simple applications of this result: (1) any data structure for storing codewords of a good code requires an additive logarithmic redundancy, if each bit of the codeword can be retrieved by a small AC0 circuit; (2) for some choice of the underlying combinatorial designs, the output distribution of Nisan´s pseudorandom generator against AC0 circuits of depth d cannot be sampled by small AC0 circuits of depth less than d.
         
        
            Keywords : 
combinational circuits; network synthesis; statistical distributions; Nisan pseudorandom generator; additive logarithmic redundancy; bounded depth circuits; classical circuit lower bound problem; codewords; combinatorial design; constant relative distance; output distribution; sample good code; small AC0 circuit; small constant depth; statistical distance; Complexity theory; Data structures; Generators; Hamming distance; Integrated circuit modeling; Noise; Sensitivity; Small-depth circuits; lower bounds; sampling distributions;
         
        
        
        
            Conference_Titel : 
Computational Complexity (CCC), 2011 IEEE 26th Annual Conference on
         
        
            Conference_Location : 
San Jose, CA
         
        
        
            Print_ISBN : 
978-1-4577-0179-5
         
        
            Electronic_ISBN : 
1093-0159
         
        
        
            DOI : 
10.1109/CCC.2011.11