DocumentCode :
237650
Title :
Insight extraction for semiconductor manufacturing processes
Author :
Pampuri, Simone ; Susto, Gian Antonio ; Jian Wan ; Johnston, Adrian ; O´Hara, Paul ; McLoone, S.
Author_Institution :
Nat. Univ. of Ireland, Maynooth, Ireland
fYear :
2014
fDate :
18-22 Aug. 2014
Firstpage :
786
Lastpage :
791
Abstract :
In the semiconductor manufacturing environment it is very important to understand which factors have the most impact on process outcomes and to control them accordingly. This is usually achieved through design of experiments at process start-up and long term observation of production. As such it relies heavily on the expertise of the process engineer. In this work, we present an automatic approach to extracting useful insights about production processes and equipment based on state-of-the-art Machine Learning techniques. The main goal of this activity is to provide tools to process engineers to accelerate the learning-by-observation phase of process analysis. Using a Metal Deposition process as an example, we highlight various ways in which the extracted information can be employed.
Keywords :
design of experiments; learning (artificial intelligence); production engineering computing; production equipment; semiconductor industry; design of experiments; information extraction; learning-by-observation phase; machine learning techniques; metal deposition process; process analysis; process engineer; production equipment; production processes; semiconductor manufacturing environment; semiconductor manufacturing processes; Adaptation models; Data mining; Metrology; Predictive models; Production; Semiconductor device modeling; Training; Metal Deposition; Moving Window; Semiconductor Manufacturing; Sparse Regression; Virtual Metrology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Automation Science and Engineering (CASE), 2014 IEEE International Conference on
Conference_Location :
Taipei
Type :
conf
DOI :
10.1109/CoASE.2014.6899415
Filename :
6899415
Link To Document :
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