Packet-based input test data compression techniques

Author

Volkerink, Erik H. ; Khoche, Ajay ; Mitra, Subhasish

Author_Institution

Center for Reliable Comput., Stanford Univ., CA, USA

fYear

2002

fDate

2002

Firstpage

154

Lastpage

163

Abstract

This paper presents a test input data compression technique, which can be used to reduce input test data volume, test time, and the number of required tester channels. The technique is based on grouping data packets and applying various binary encoding techniques, such as Huffman codes and Golomb-Rice codes. Experiments on actual industrial designs and benchmark circuits show an input vector data reduction ranging from 17× to 70×.

Keywords

Huffman codes; automatic test equipment; automatic test pattern generation; built-in self test; data compression; integrated circuit testing; performance evaluation; ATE; ATPG; BIST; Golomb-Rice codes; Huffman codes; automatic test equipment; automatic test pattern generation; benchmark testing; binary encoding techniques; built in self test; data packet grouping techniques; input test data volume reduction; input vector data reduction; packet-based input test data compression techniques; test time reduction; tester channel number reduction; Bandwidth; Benchmark testing; Built-in self-test; Circuit testing; Cyclic redundancy check; Data compression; Frequency; Laboratories; Test data compression; Vectors;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2002. Proceedings. International

ISSN

1089-3539

Print_ISBN

0-7803-7542-4

Type

conf

DOI

10.1109/TEST.2002.1041756

Filename

1041756