Title :
Effects of various unbalanced voltages on the operation performance of an induction motor under the same voltage unbalance factor condition
Author :
Lee, Ching-Yin ; Chen, Bin-Kwie ; Lee, Wei-Jen ; Hsu, Yen-Feng
Author_Institution :
Nat. Taipei Inst. of Technol., Taiwan
Abstract :
This paper investigates the effects of different unbalanced voltages with the same voltage unbalance factor (VUF) on the performance of a three-phase induction motor and its feedback influence on the power system. Under eight different voltage unbalance conditions, the performance of a three-phase induction motor was measured through a real load test. The loss, efficiency, power factor and temperature rise of the motor under different unbalanced voltages are investigated. According to the test results and analysis, the importance of the positive-sequence voltage on the motor´s apparent performance and the negative-sequence voltage in the hidden damage were pointed out. Finally, it is strongly suggested that: (1) the derating and temperature rise curves and related regulations should consider the VUF percent and the magnitude of positive-sequence voltage; and (2) the effects of unbalanced voltage on induction motors should also be modeled in power system voltage stability studies
Keywords :
induction motors; load (electric); machine testing; machine theory; power system stability; power system transients; thermal analysis; transient analysis; apparent performance; efficiency; hidden damage; load test; loss; negative-sequence voltage; operation performance; positive-sequence voltage; power factor; power system effects; power system voltage stability; temperature rise; three-phase induction motor; unbalanced voltages; voltage unbalance factor; Feedback; Induction motors; Power system analysis computing; Power system measurements; Power system modeling; Power system stability; Reactive power; Temperature; Testing; Voltage;
Conference_Titel :
Industrial and Commercial Power Systems Technical Conference, 1997. Conference Record, Papers Presented at the 1997 Annual Meeting., IEEE 1997
Conference_Location :
Philadelphia, PA
Print_ISBN :
0-7803-3825-1
DOI :
10.1109/ICPS.1997.595989