Title :
On-chip repair and an ATE independent fusing methodology
Author :
Cowan, Bruce ; Farnsworth, Owen ; Jakobsen, Peter ; Oakland, Steve ; Ouellette, Michael R. ; Wheater, Donald L.
Author_Institution :
IBM, Essex Junction, VT, USA
Abstract :
This paper describes a novel on chip repair system designed for ATE independent application on many unique very dense ASIC devices in a high turnover environment. During test, the system controls on chip built-in self-test (BIST) engines, collects and compresses repair data, programs fuses and finally decompresses and reloads the repair data for post fuse testing. In end use applications this system decompresses and loads the repair data at power-up or at the request of the system.
Keywords :
application specific integrated circuits; automatic test equipment; built-in self test; electric fuses; integrated circuit testing; maintenance engineering; ASIC on-chip repairs; ATE independent fusing methodology; BIST; built-in self-test engines; e-fuse programming; electrically programmed fuses; high turnover environment; on chip repair systems; post fuse testing; repair data collection/compression; repair data decompression/reloading; unique very dense ASIC devices; Application specific integrated circuits; Automatic testing; Control systems; Engines; Fuses; Laser theory; Process design; Silicon; System testing; System-on-a-chip;
Conference_Titel :
Test Conference, 2002. Proceedings. International
Print_ISBN :
0-7803-7542-4
DOI :
10.1109/TEST.2002.1041759
