On-chip repair and an ATE independent fusing methodology

Author

Cowan, Bruce ; Farnsworth, Owen ; Jakobsen, Peter ; Oakland, Steve ; Ouellette, Michael R. ; Wheater, Donald L.

Author_Institution

IBM, Essex Junction, VT, USA

fYear

2002

fDate

2002

Firstpage

178

Lastpage

186

Abstract

This paper describes a novel on chip repair system designed for ATE independent application on many unique very dense ASIC devices in a high turnover environment. During test, the system controls on chip built-in self-test (BIST) engines, collects and compresses repair data, programs fuses and finally decompresses and reloads the repair data for post fuse testing. In end use applications this system decompresses and loads the repair data at power-up or at the request of the system.

Keywords

application specific integrated circuits; automatic test equipment; built-in self test; electric fuses; integrated circuit testing; maintenance engineering; ASIC on-chip repairs; ATE independent fusing methodology; BIST; built-in self-test engines; e-fuse programming; electrically programmed fuses; high turnover environment; on chip repair systems; post fuse testing; repair data collection/compression; repair data decompression/reloading; unique very dense ASIC devices; Application specific integrated circuits; Automatic testing; Control systems; Engines; Fuses; Laser theory; Process design; Silicon; System testing; System-on-a-chip;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2002. Proceedings. International

ISSN

1089-3539

Print_ISBN

0-7803-7542-4

Type

conf

DOI

10.1109/TEST.2002.1041759

Filename

1041759