DocumentCode :
2376935
Title :
Advantages of switched reluctance motor applications to EV and HEV: design and control issues
Author :
Rahman, K.M. ; Fahimi, B. ; Suresh, G. ; Rajarathnam, A.V. ; Ehsani, M.
Author_Institution :
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
Volume :
1
fYear :
1998
fDate :
12-15 Oct. 1998
Firstpage :
327
Abstract :
The purpose of this paper is to investigate the capabilities of switched reluctance motors (SRMs) for EV and HEV applications. This investigation is carried out in two steps. The first step involves the machine design and the finite element analysis to obtain the static characteristic of the motor. In the second step, the finite element field solutions are used in the development of a nonlinear model to investigate the dynamic performance of the designed motor. Several 8-6 and 6-4 SRM geometries are investigated. The effects of different stator and rotor pole widths and pole heights on the steady state as well as on the dynamic performance of the motor are studied. Simulation results of the designed SRM are presented for vehicle acceleration. To demonstrate the SRM´s capability in producing an extended constant power range, experimental results are presented; however, for a reduced size motor available commercially.
Keywords :
electric vehicles; finite element analysis; machine control; machine testing; machine theory; optimal control; reluctance motors; rotors; stators; traction motors; SRM geometries; applications; control issues; design issues; dynamic performance; electric vehicles; finite element analysis; finite element field solutions; hybrid electric vehicles; rotor pole height; rotor pole width; static characteristic; stator pole height; stator pole width; switched reluctance motor; Acceleration; Finite element methods; Geometry; Hybrid electric vehicles; Reluctance machines; Reluctance motors; Rotors; Stators; Steady-state; Vehicle dynamics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 1998. Thirty-Third IAS Annual Meeting. The 1998 IEEE
Conference_Location :
St. Louis, MO, USA
ISSN :
0197-2618
Print_ISBN :
0-7803-4943-1
Type :
conf
DOI :
10.1109/IAS.1998.732314
Filename :
732314
Link To Document :
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