• DocumentCode
    2376972
  • Title

    Verifying properties using sequential ATPG [IC design]

  • Author

    Abraham, J.A. ; Vedula, V.M.

  • Author_Institution
    Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    194
  • Lastpage
    202
  • Abstract
    This paper develops a novel approach for formally verifying both safety and liveness properties of designs using sequential ATPG tools. The properties are automatically mapped into a monitor circuit with a target fault so that finding a test for the fault corresponds to formally establishing the property. The mapping of the properties to the monitor circuit is described in detail and the process is shown to be sound and complete. Experimental results show that the ATPG-based approach performs better than existing verification techniques, especially for large designs.
  • Keywords
    automatic test pattern generation; formal verification; integrated circuit design; integrated circuit modelling; integrated circuit testing; performance evaluation; IC design property formal verification techniques; benchmark testing; design safety/liveness properties; fault test generation; integrated circuit design validation; monitor circuit target faults; property automatic monitor circuit mapping; property formal establishment; sequential ATPG tools; Automatic test pattern generation; Boolean functions; Circuit faults; Circuit testing; Data structures; Design engineering; Jacobian matrices; Logic; Protons; Safety;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2002. Proceedings. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-7542-4
  • Type

    conf

  • DOI
    10.1109/TEST.2002.1041761
  • Filename
    1041761