• DocumentCode
    2376976
  • Title

    Dealing with Ill Conditioning in Recursive Parameter Estimation for a Synchronous Generator

  • Author

    Nino, Carlos E. ; Reyes, Miguel Velez

  • Author_Institution
    Center for Power Electron. Syst., Puerto Rico Univ., Mayaguez
  • fYear
    2006
  • fDate
    6-10 Nov. 2006
  • Firstpage
    1089
  • Lastpage
    1094
  • Abstract
    This paper presents how to deal with ill-conditioning in recursive parameter identification for a synchronous generator using subset selection, the extended Kalman filter (EKF), and the iterated extended Kalman filter (IEKF). The problem of ill conditioning of the parameter estimation is caused by system inputs that are not rich enough to fully excite all system modes. We present how the quality of parameter estimated for ill-conditioned parameter estimation problems is significantly affected by noise and we show how by proper modifications to the EKF we still extract useful parameter estimates from low quality data. The methodology is based on the subset selection method, where a subset of parameters is fixed to prior values to reduce the ill-conditioning of the estimation problem. Simulation studies using a linearized model of a synchronous generator are presented to illustrate the concepts being studied in this work
  • Keywords
    Kalman filters; feature extraction; iterative methods; nonlinear filters; power filters; recursive estimation; synchronous generators; extended Kalman filter; iterated extended Kalman filter; recursive parameter estimation; subset selection method; synchronous generator; Parameter estimation; Power system analysis computing; Power system dynamics; Power system modeling; Power system stability; Power system transients; Predictive models; Student members; Synchronous generators; Testing; Conditioning analysis; Extended Kalman Filter; Parameter Estimation; Subset selection; Synchronous Generator;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IEEE Industrial Electronics, IECON 2006 - 32nd Annual Conference on
  • Conference_Location
    Paris
  • ISSN
    1553-572X
  • Print_ISBN
    1-4244-0390-1
  • Type

    conf

  • DOI
    10.1109/IECON.2006.348110
  • Filename
    4153649