DUT capture using simultaneous logic acquisition

The capability to acquire and display waveforms from a device under test (DUT) perspective, is an essential feature of all automatic test equipment (ATE) systems used in device debug situations. The way the signals are acquired and how they are displayed varies from test system to test system. The tool that performs such functions is called a logic analyzer or a scope. In this paper we describe an acquisition technique which uses strobes in conjunction with capture memory to acquire signals to and from the DUT. What makes this technique new is that the strobe events are designed into the timing IC of the test system. The waveforms are acquired simultaneously on all DUT pins with 4 constant strobes per 5 ns, without any modifications to the timing and waveform memories that are normally done in contemporary ATE architectures.