Title :
Considerations for STIL data application
Author :
Maston, Gregory A.
Author_Institution :
Nanometer Anal. & Test, Synopsys Inc., Mountain View, CA, USA
Abstract :
The relatively new Standard Test Interface Language (STIL) facilitates the transportation of digital test data from creation in computer-aided engineering (CAE) environments, to use on automated test equipment (ATE). Attempts to use STIL for this purpose have identified apparent disconnects in this flow. This paper presents disconnects identified to date, their causes, and presents solutions to address these issues. A practical example is presented of the process for transitioning an existing, known-good test flow to this new environment.
Keywords :
automatic test equipment; automatic test pattern generation; computer aided engineering; electronic data interchange; standards; ATE; CAE environments; STIL data application considerations; Standard Test Interface Language; automated test equipment; computer-aided engineering; digital test data transportation; known-good test flow transition process; transportation flow disconnects; Automatic testing; Computer aided engineering; Computer interfaces; Cost function; Data engineering; Environmental economics; IEEE news; Proposals; Test equipment; Transportation;
Conference_Titel :
Test Conference, 2002. Proceedings. International
Print_ISBN :
0-7803-7542-4
DOI :
10.1109/TEST.2002.1041771