Title : 
120-GHz-band Low-noise Amplifier with 14-ps Group-delay Variation for 10-Gbit/s Data Transmission
         
        
            Author : 
Takahashi, Hiroyuki ; Kosugi, Toshihiko ; Hirata, Akihiko ; Murata, Koichi ; Kukutsu, Naoya
         
        
            Author_Institution : 
NTT Microsyst. Integration Labs., NTT Corp., Atsugi
         
        
        
        
        
        
            Abstract : 
This paper presents a 120-GHz-band low-noise amplifier (LNA) for a receiver microwave monolithic integrated circuit (MMIC), which is used for a 10-Gbit/s wireless link. The LNA was designed for low-noise performance, a high gain, and low group-delay variation. To achieve enough stability with low-noise performance and low group-delay variation, we introduce a new stabilizing circuit consisting of two coplanar-waveguide stubs. The LNA MMIC was fabricated using 0.1-mum-gate InP high-electron-mobility transistors (HEMTs). We integrated the LNA into a WR-8 (90-140 GHz) waveguide module and evaluated it. The LNA module achieved an averaged noise figure of 5.6 dB, a gain of > 19.5 dB, and group-delay variation of < 14 ps from 117.5 to 132.5 GHz.
         
        
            Keywords : 
HEMT integrated circuits; III-V semiconductors; MMIC amplifiers; coplanar waveguides; field effect MIMIC; indium compounds; low noise amplifiers; radiocommunication; 14-ps group-delay variation; InP; MM-wave circuits; WR-8 waveguide module; bit rate 10 Gbit/s; coplanar-waveguide stubs; data transmission; frequency 90 GHz to 140 GHz; high-electron-mobility transistors; low-noise amplifier; receiver microwave monolithic integrated circuit; size 0.1 mum; wireless link; Circuit stability; Data communication; HEMTs; Indium phosphide; Low-noise amplifiers; MMICs; MODFETs; Monolithic integrated circuits; Noise figure; Performance gain;
         
        
        
        
            Conference_Titel : 
Microwave Conference, 2008. EuMC 2008. 38th European
         
        
            Conference_Location : 
Amsterdam
         
        
            Print_ISBN : 
978-2-87487-006-4
         
        
        
            DOI : 
10.1109/EUMC.2008.4751741