DocumentCode
2377332
Title
A new algorithm for global fault collapsing into equivalence and dominance sets
Author
Prasad, A.V.S.S. ; Agrawal, Vishwani D. ; Atre, Madhusudan V.
Author_Institution
Agere Syst., Bangalore, India
fYear
2002
fDate
2002
Firstpage
391
Lastpage
397
Abstract
Nodes in a dominance graph represent faults of a circuit. A directed edge from node fi to node fj means that fault fj dominates fi. The equivalence of faults fi and fj is indicated by the presence of simultaneous edges fi → fj and fj → fi. When local dominance and equivalence relations are included in this graph, its transitive closure provides the collapsed fault sets. Pre-collapsed fault sets of standard cells and other logic blocks can be stored in a graph library for hierarchical fault collapsing. Examples show how more compact fault sets are obtained by using functional equivalences that can be found by analysis of small cells. Benchmark circuits c432 and c499 are used to illustrate the use of functional fault collapsing within their exclusive-OR cells.
Keywords
automatic test pattern generation; circuit analysis computing; computational complexity; fault simulation; graph theory; logic testing; ATPG programs; collapsed fault sets; compact fault sets; computational complexity; exclusive-OR cells; fault dominance graph; fault simulation programs; functional equivalences; functional fault collapsing; global fault collapsing algorithm; graph representation; hierarchical fault collapsing; large circuits; logic blocks; pre-collapsed graph libraries; standard cells; transitive closure; Automatic test pattern generation; Benchmark testing; Circuit faults; Circuit testing; Fault detection; Libraries; Logic design; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2002. Proceedings. International
ISSN
1089-3539
Print_ISBN
0-7803-7542-4
Type
conf
DOI
10.1109/TEST.2002.1041783
Filename
1041783
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