Title :
A Wide Tuning Range MEMS Varactor Based on a Toggle Push-Pull Mechanism
Author :
Farinelli, Paola ; Solazzi, Francesco ; Calaza, Carlos ; Margesin, Benno ; Sorrentino, Roberto
Author_Institution :
RF Microtech, Perugia
Abstract :
This paper presents a novel wide tuning range MEMS varactor based on a toggle push-pull mechanism for high RF power applications and improved reliability. The device anchoring utilizes a torsion spring mechanism which virtually allows for a full capacitance tuning range. Improved mechanical stability is also provided by the actively controlled pull-out implementation that is realized without increasing the MEMS manufacturing complexity. As a proof of concept, a toggle MEMS varactor has been modeled, designed and manufactured in shunt configuration on a 50 coplanar transmission line. Analytical and full wave electromechanical models are provided as well as electromagnetic characterization. The device has been manufactured on HR Silicon substrate by using the standard FBK-irst RF MEMS process. Optical profile, DC and RF measurements are presented in the 0 - 40 GHz frequency band. Excellent RF performance as well as a capacitance tuning ratio of 2.5 has been obtained.
Keywords :
coplanar transmission lines; mechanical stability; micromechanical devices; microwave devices; microwave measurement; reliability; varactors; FBK-irst RF MEMS process; MEMS manufacturing complexity; actively controlled pull-out implementation; capacitance tuning; coplanar transmission line; electromagnetic characterization; frequency 0 GHz to 40 GHz; full wave electromechanical model; high RF power applications; mechanical stability; resistance 50 ohm; toggle push-pull mechanism; torsion spring mechanism; wide tuning range MEMS varactor; Capacitance; Coplanar transmission lines; Electromagnetic analysis; Electromagnetic modeling; Micromechanical devices; Radio frequency; Springs; Stability; Varactors; Virtual manufacturing;
Conference_Titel :
Microwave Conference, 2008. EuMC 2008. 38th European
Conference_Location :
Amsterdam
Print_ISBN :
978-2-87487-006-4
DOI :
10.1109/EUMC.2008.4751752