Title :
A set of benchmarks for modular testing of SOCs
Author :
Marinissen, Erik Jan ; Iyengar, Vikram ; Chakrabarty, Krishnendu
Author_Institution :
IC Design - Digital Design & Test, Philips Res. Labs., Eindhoven, Netherlands
Abstract :
This paper presents the ITC´02 SOC test benchmarks. The purpose of this new benchmark set is to stimulate research into new methods and tools for modular testing of SOCs and to enable the objective comparison of such methods and tools with respect to effectiveness and efficiency. The paper defines the benchmark format and naming scheme, and presents the benchmark SOCs. In addition, it provides an overview of the research problems that can be addressed and evaluated by means of this benchmark set. These research problems include the design of optimized test access infrastructures and test schedules.
Keywords :
automatic testing; circuit optimisation; integrated circuit testing; logic testing; performance evaluation; scheduling; system-on-chip; ITC´02 SOC test benchmarks; SOC modular testing benchmark set; SOC test automation; benchmark format/naming scheme; benchmark set research problems; modular testing methods/tools comparison; optimized test access infrastructures; system-on-chip; test schedule design; Application specific integrated circuits; Automatic testing; Benchmark testing; Circuit testing; Integrated circuit testing; Laboratories; Logic testing; Microelectronics; Rivers; System testing;
Conference_Titel :
Test Conference, 2002. Proceedings. International
Print_ISBN :
0-7803-7542-4
DOI :
10.1109/TEST.2002.1041802
