Title :
On the use of k-tuples for SoC test schedule representation
Author :
Koranne, Sandeep ; Iyengar, Vikram
Author_Institution :
Tanner Res. Inc., Pasadena, CA, USA
Abstract :
Test scheduling and TAM (test access mechanism) optimization for core-based SoCs is a challenging problem. Test schedules must be crafted with the objectives of minimizing testing time to reduce test cost, under the constraints of total available TAM width. Moreover precedence relations and power constraints must be met to ensure safe, effective, and high-quality testing. Prior research in test scheduling has mainly used constructive approaches such as rectangle packing to solve this problem, but these approaches fail to address the problem of creating a simple, standard representation for SoC test schedules that can be used by a wide range of optimization algorithms. In this paper we present a novel and efficient method to represent SoC test schedules and TAM width assignment based on the use of k-tuples. The proposed approach provides a compact, standardized representation of test schedules. This facilitates fast and efficient evaluation of SoC test automation solutions to reduce test costs. We propose heuristic algorithms based on the use of k-tuples to solve scheduling problems for SoCs in an efficient manner; extensions to our method to incorporate precedence relations among tests and power constraints in the schedule are also presented. Finally, experimental results using the new ITC´02 SoC benchmarks validate the quality of our solutions.
Keywords :
automatic testing; circuit optimisation; integrated circuit design; integrated circuit economics; integrated circuit testing; logic testing; performance evaluation; scheduling; system-on-chip; ITC´02 SOC benchmark tests; SOC test automation evaluation; SOC test schedule standard representation; TAM optimization; TAM width assignment; core-based SOC test scheduling; heuristic algorithms; k-tuple SOC test schedule representation; optimization algorithms; power constraints; precedence relations; rectangle packing; system-on-chip; test access mechanisms; test cost reduction; test time minimization; total available TAM width constraints; Automatic testing; Automation; Benchmark testing; Bismuth; Costs; Firewire; Heuristic algorithms; Integrated circuit testing; Knowledge transfer; Scheduling algorithm;
Conference_Titel :
Test Conference, 2002. Proceedings. International
Print_ISBN :
0-7803-7542-4
DOI :
10.1109/TEST.2002.1041804