DocumentCode :
2377661
Title :
Physical principles of interface design
Author :
Sargent, Todd
Author_Institution :
Intest Corp., Sunnyvale, CA, USA
fYear :
2002
fDate :
2002
Firstpage :
549
Lastpage :
554
Abstract :
In the past, the test interface did not need to be modeled well, operating at low speed. As bandwidth increases past 1 GHz, the interface needs to be modeled according to its distributed properties. By comparing S-parameters of a correct model with an ostensibly similar RC filter model, the author critiques the suitability of oversimplifying the test interface model. Bandwidth limitation in PCBs, as caused by the physical properties of materials and characteristic trace geometry, is examined as the central theme. The two most significant material effects, conductor and dielectric losses, are isolated, modeled, and derivations of the frequency and step responses are presented. As mismatches are reduced, it is shown that these losses become the dominant limitations to bandwidth until a change to superior dielectric material in load boards and probe cards is made.
Keywords :
RC circuits; S-parameters; circuit simulation; frequency response; high-frequency transmission lines; impedance matching; integrated circuit testing; losses; printed circuit design; probes; step response; test equipment; 1 GHz; IC test system interface design; PCB bandwidth limitations; PCB material properties; RC filter models; S-parameters; bandwidth dominant limitations; conductor losses; dielectric losses; frequency response; impedance matching; integrated circuit tester interface; interface transmission lines; load board dielectric materials; mismatch reduction; probe cards; step response; test interface modeling; trace geometry characteristics; transmission line theory; Bandwidth; Conducting materials; Dielectric losses; Dielectric materials; Filters; Frequency; Geometry; Probes; Scattering parameters; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2002. Proceedings. International
ISSN :
1089-3539
Print_ISBN :
0-7803-7542-4
Type :
conf
DOI :
10.1109/TEST.2002.1041805
Filename :
1041805
Link To Document :
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